Optical PV Cell Testing System Provides Non-Destructive Analysis

CRAIC Technologies released the 20/20(TM) UV-visible-NIR microspectrophotometer.  20/20(TM) microspectrophotometer is designed to non-destructively analyze many types of microscopic samples from the deep ultraviolet to the near infrared. Analysis of samples can be done by absorbance, reflectance, luminescence and fluorescence with unparalleled speed and accuracy. The system can also be configured to image microscopic samples in the UV and NIR regions in addition to color imaging.

Applications are numerous and include forensic analysis of trace evidence, vitrinite reflectance of coal and spectral analysis of minerals, measurement of protein crystals, contamination analysis and thin film measurement of semiconductors, hard disks and flat panel displays.

The 20/20(TM) microspectrophotometer integrates an advanced spectrophotometer with a sophisticated UV-visible-NIR range microscope and powerful, easy-to-use software. This flexible instrument is designed to acquire data from microscopic samples by absorbance, reflectance or even luminescence spectroscopy. By including high-resolution digital imaging, the user is also able to use the instrument as a ultraviolet or infrared microscope. Touch screen controls, sophisticated software, calibrated variable apertures and other innovations all point to a new level of sophistication for microanalysis.

www.microspectra.com